A team of scientists from McGill University in Canada has developed a new method for finding defects in optical detectors and fiber tiles. Now this procedure can be done almost instantly.
The study was carried out using atomic force microscopy. This made it possible to detect superfast forces that arise when light and matter interact. Moreover, they can be detected with high accuracy, up to a billionth of a second, according to the university's website.
According to scientists, their discovery will improve optical detectors in cameras and smartphones, and fiber optics for solar batteries or
solar panels - universal chargers.
It is noted that the new method can be applied to any material - metals, semiconductors or insulators. This will affect their study, understanding and improvement of work.
Earlier, researchers from the University of Birmingham have developed a
new method allowing fast plastic recycling. As a result, they receive a biosolvent, which is reused in various industries.